| Low-Frequency Noise in Advanced MOS Devices |
| 価格 ：\17,736（税込） |
| Table of Contents:Chapter 1 Fundamental noise mechanisms. Introduction. Basic noise theory. Fundamental noise sources. Noise circuit analysis./ Chapter 2 Noise characterization. Introduction. Low-frequency noise measurements. Noise as a diagnostic tool./ Chapter 3 1/f noise in MOSFETs - origins and modelling. Introduction. MOSFET noise model. Number fluctuations, Mobility fluctuations. Impact of substrate voltage. Compact noise models. Input referred noise./ Chapter 4 1/f Noise performance of advanced CMOS devices. Introduction. 1/f noise performance overview. 1/f noise performance of ultra-scaled devices. SiGe channel pMOSFETs. Strained Si devices. Silicon-on-insulator devices. MOSFETs with high-k gate dielectrics. Metal gate devices. Multiple gate devices./ Chapter 5 Introduction to noise in RF/analog circuits. Introduction. Upconversion of noise. Voltage controlled oscillator (VCO). Mixer. Low-Noise Amplifier (LNA)/ Appendix I List of Symbols/ Appendix II List of Acronyms/Appendix III Solution to Problems/Index |
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ISBN10 ：
ISBN13 ： 978-1-4020-5909-4 |
| 著者 |
Martin V. Haartman & Mikael Oestring |
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Springer |
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| Low-Frequency Noise in Advanced MOS Devices |
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